Live Webinar on December 18, 2024
Elemental Analysis of Vanadium Electrolytes Using ICP-OES and ED-XRF Technology
This live webinar will present an in-depth analysis of vanadium electrolytes using ICP-OES and ED-XRF technology. The analysis is essential for the optimization and quality control of vanadium redox flow batteries (VRFBs), which are recognized for their scalability, long lifespan, and high energy storage capacity. As VRFBs are increasingly integrated into renewable energy systems, ensuring the purity and chemical stability of vanadium electrolytes becomes critical for maintaining performance and extending battery life.
The SPECTRO ARCOS ICP-OES, equipped with DSOI, delivers enhanced sensitivity and precision, making it particularly effective in detecting trace elements that may affect electrolyte performance. The webinar will outline the instrument’s capacity to meet current quality standards and its potential for future adaptability. The precision offered by the SPECTRO ARCOS ensures that even minor impurities are detected, thus facilitating better control over the electrolyte formulation and enhancing the efficiency of VRFBs in renewable energy applications.
The SPECTRO XEPOS ED-XRF analyzer delivers high sensitivity and flexibility, enabling accurate multi-elemental analysis of vanadium electrolytes, from trace to major components. With detailed experimental data on electrolyte samples at various states, the webinar will highlight how ED-XRF technology can identify and quantify impurities that could impact the efficiency and lifespan of VRFBs.
The webinar will take place on Wednesday, December 18, and will take around 30 minutes, after which we'll answer your questions live.
Join us Live:
- at 2:00 PM IST, 4:30 PM SGT, 8:30 AM GMT, 9:30 AM CET (Time Slot 1)
- or at 8:00 AM PST, 11:00 EST, 4:00 PM GMT, 5:00 PM CET (Time Slot 2)
The Presenters
Olaf Schulz is SPECTRO's product manager for ICP-OES and is responsible for the strategic development of the complete product line including application development and product support. Olaf’s experience in optical emission spectroscopy for material analysis and testing spans more than 30 years.
Volker Hückelkamp is XRF Application Scientist in the Product Support XRF Group and responsible for application development, training, and demonstration of the entire XRF portfolio. Volker’s experience in spectroscopy began with his graduate work in physics at the Heinrich Heine University in Düsseldorf, Germany, in the department of applied physics researching thin layer crystal growth with various spectroscopic tools like Low-energy electron diffraction (LEED) or scanning tunneling microscope (STM). Volker joined SPECTRO Analytical instruments GmbH in 2010.
Register now for this informative event!